A Scanning Electron Microscope (SEM) applies an electron beam to generate secondary electron and backscattered electron images of a sample, and provides detailed surface information including topography, morphology, composition, and crystallography.
A field-emission scanning electron microscope (FESEM) uses a field-emission electron gun that provides narrower probing beams at low as well as high electron energy, resulting in both improved spatial resolution and minimized sample charging and damage compared to a regular SEM. Therefore, the FESEM offers ultra high resolution secondary electron imaging of a variety of samples. It can achieve magnifications that range from 25x to approximately 1,000,000X and has excellent depth of field.
Our JEOL (JSM-7500F) FESEM is specifically suited for high-magnification investigation of catalyst surface features at the micro-scale, as well as in traditional metallurgical applications where lower magnifications are needed. With the addition of an Energy Dispersive Spectroscopy (EDS) detector, the FESEM capabilities have been expanded to include elemental analysis of the sample being imaged.
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